Kuniyoshi Takeuchi

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Height measuring apparatus and method and testing apparatus using t...
- Patent number 6,330,066
- Issue date Dec 11, 2001
- Sony Corporation
- Minoru Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method and inspecting apparatus for liquid crystal displ...
- Patent number 6,064,462
- Issue date May 16, 2000
- Sony Corporation
- Kuniyoshi Takeuchi
- G02 - OPTICS