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Kuniyuki Kakushima
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Yokohama Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Charge trap evaluation method and semiconductor element
Patent number
11,652,150
Issue date
May 16, 2023
Sumitomo Chemical Company, Limited
Kuniyuki Kakushima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for evaluating electrical defect density of semiconductor la...
Patent number
11,513,149
Issue date
Nov 29, 2022
Sumitomo Chemical Company, Limited
Kuniyuki Kakushima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photon counting-type radiation detector and radiological inspection...
Patent number
10,964,836
Issue date
Mar 30, 2021
Kabushiki Kaisha Toshiba
Kuniyuki Kakushima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrode material, and electrode layer, battery, and electrochromi...
Patent number
10,283,776
Issue date
May 7, 2019
Kabushiki Kaisha Toshiba
Akito Sasaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
9,343,536
Issue date
May 17, 2016
Kabushiki Kaisha Toshiba
Wataru Saito
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Resistance change memory device
Patent number
9,214,626
Issue date
Dec 15, 2015
Tokyo Institute of Technology
Kuniyuki Kakushima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrostatic micro actuator, electrostatic microactuator apparatus...
Patent number
7,825,755
Issue date
Nov 2, 2010
The Foundation for the Promotion of Industrial Science
Hiroshi Toshiyoshi
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Semiconductor device and method for fabricating the same
Patent number
7,800,181
Issue date
Sep 21, 2010
Panasonic Corporation
Yasutoshi Okuno
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR EVALUATING ELECTRICAL DEFECT DENSITY OF SEMICONDUCTOR LA...
Publication number
20200225276
Publication date
Jul 16, 2020
Sumitomo Chemical Company, Limited
Kuniyuki KAKUSHIMA
G01 - MEASURING TESTING
Information
Patent Application
CHARGE TRAP EVALUATION METHOD AND SEMICONDUCTOR ELEMENT
Publication number
20200203493
Publication date
Jun 25, 2020
Sumitomo Chemical Company, Limited
Kuniyuki KAKUSHIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTON COUNTING-TYPE RADIATION DETECTOR AND RADIOLOGICAL INSPECTION...
Publication number
20200041663
Publication date
Feb 6, 2020
Kabushiki Kaisha Toshiba
Kuniyuki KAKUSHIMA
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
ELECTRODE MATERIAL, AND ELECTRODE LAYER, BATTERY, AND ELECTROCHROMI...
Publication number
20170256797
Publication date
Sep 7, 2017
Kabushiki Kaisha Toshiba
Akito SASAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20160043187
Publication date
Feb 11, 2016
Kabushiki Kaisha Toshiba
Wataru Saito
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RESISTANCE CHANGE MEMORY DEVICE
Publication number
20150083987
Publication date
Mar 26, 2015
TOKYO INSTITUTE OF TECHNOLOGY
Kuniyuki Kakushima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROSTATIC MICRO ACTUATOR, ELECTROSTATIC MICROACTUATOR APPARATUS...
Publication number
20090102006
Publication date
Apr 23, 2009
Hiroshi Toshiyoshi
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
Ge channel device and method for fabricating ge channel device
Publication number
20090057739
Publication date
Mar 5, 2009
Tokyo Institute of Technology
Hiroshi Iwai
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Semiconductor device and method for fabricating the same
Publication number
20070093047
Publication date
Apr 26, 2007
Yasutoshi Okuno
H01 - BASIC ELECTRIC ELEMENTS