Kunji Shigeto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and sample observation method
- Patent number 11,393,658
- Issue date Jul 19, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuki Tani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample observation method using...
- Patent number 11,120,967
- Issue date Sep 14, 2021
- HITACHI HIGH-TECH CORPORATION
- Kunji Shigeto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for adjusting charged particle beam device and adjusting bea...
- Patent number 10,176,968
- Issue date Jan 8, 2019
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and charged particle beam device contr...
- Patent number 9,881,769
- Issue date Jan 30, 2018
- Hitachi High-Technologies Corporation
- Kenji Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, specimen observation system and op...
- Patent number 9,792,832
- Issue date Oct 17, 2017
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display screen with graphical user interface
- Patent number D778920
- Issue date Feb 14, 2017
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Display screen with graphical user interface
- Patent number D774047
- Issue date Dec 13, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,129,773
- Issue date Sep 8, 2015
- Hitachi High-Technologies Corporation
- Tohru Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,058,957
- Issue date Jun 16, 2015
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,124,940
- Issue date Feb 28, 2012
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus and Sample Observation Method
- Publication number 20220037112
- Publication date Feb 3, 2022
- Yuki TANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Sample Observation Method
- Publication number 20190279838
- Publication date Sep 12, 2019
- Hitachi High-Technologies Corporation
- Kunji SHIGETO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Device and Charged Particle Beam Device Contr...
- Publication number 20160203947
- Publication date Jul 14, 2016
- Hitachi High-Technologies Corporation
- Kenji AOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Method for Adjusting Charged Parti...
- Publication number 20160118218
- Publication date Apr 28, 2016
- Hitachi High-Technologies Corporation
- Kunji SHIGETO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20150144804
- Publication date May 28, 2015
- Hitachi High-Technologies Corporation
- Tohru Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...
- Publication number 20150074523
- Publication date Mar 12, 2015
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140131590
- Publication date May 15, 2014
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20090184256
- Publication date Jul 23, 2009
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS

Kunji Shigeto

Person

Patents Grantslast 30 patents

Charged particle beam apparatus and sample observation method

Charged particle beam apparatus and sample observation method using...

Method for adjusting charged particle beam device and adjusting bea...

Charged particle beam device and charged particle beam device contr...

Charged particle beam apparatus, specimen observation system and op...

Display screen with graphical user interface

Display screen with graphical user interface

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Patents Applicationslast 30 patents

Charged Particle Beam Apparatus and Sample Observation Method

Charged Particle Beam Apparatus and Sample Observation Method

Charged Particle Beam Device and Charged Particle Beam Device Contr...

Charged Particle Beam Device and Method for Adjusting Charged Parti...

Charged Particle Beam Apparatus

CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS