Kunlun Kenny JIANG

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Richmond Hill, CA

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Patents Grantslast 30 patents

Information Patent Grant
Loopback testing with phase alignment of a sampling clock at a test...
- Patent number 8,468,398
- Issue date Jun 18, 2013
- Advanced Micro Devices, Inc.
- Kunlun Kenny Jiang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LOOPBACK TESTING WITH PHASE ALIGNMENT OF A SAMPLING CLOCK AT A TEST...
- Publication number 20120192043
- Publication date Jul 26, 2012
- ATI Technologies ULC
- Kunlun Kenny JIANG
- G01 - MEASURING TESTING