Kuo-Chin Lin

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Sacramento, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Process control using process data and yield data
- Patent number 7,996,102
- Issue date Aug 9, 2011
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Grant
Process control using process data and yield data
- Patent number 7,622,308
- Issue date Nov 24, 2009
- MKS Instruments, Inc.
- Lawrence Hendler
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Multivariate control of semiconductor processes
- Patent number 7,151,976
- Issue date Dec 19, 2006
- MKS Instruments, Inc.
- Kuo-Chin Lin
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Electron impact ion source for trace analysis
- Patent number 4,689,574
- Issue date Aug 25, 1987
- UTI Instrument Co.
- Kuo-Chin Lin
- G01 - MEASURING TESTING
Information Patent Grant
Electron impact ion source for trace analysis
- Patent number 4,579,144
- Issue date Apr 1, 1986
- UTI Instrument Company
- Kuo-Chin Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESS CONTROL USING PROCESS DATA AND YIELD DATA
- Publication number 20100100223
- Publication date Apr 22, 2010
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
Process Control Using Process Data and Yield Data
- Publication number 20090228247
- Publication date Sep 10, 2009
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
Multivariate control of semiconductor processes
- Publication number 20060111804
- Publication date May 25, 2006
- MKS, INSTRUMENTS, INC.
- Kuo-Chin Lin
- G05 - CONTROLLING REGULATING