Kuo Hung Shih

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Miaoli, TW

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Patents Applicationslast 30 patents

Information Patent Application
Circuit for enhancing scan testing capability of a digital IC tester
- Publication number 20040037227
- Publication date Feb 26, 2004
- Kuo-Hung Shih
- G01 - MEASURING TESTING
Information Patent Application
Method and system for managing integrated circuit test programs usi...
- Publication number 20030136840
- Publication date Jul 24, 2003
- Ming Mei Wu
- G01 - MEASURING TESTING