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Kurt Owen Taylor
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for determining projected lifetime of semiconductor devices...
Patent number
7,340,360
Issue date
Mar 4, 2008
Advanced Micro Devices, Inc.
John Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining the reliability of dielectric layers
Patent number
7,205,165
Issue date
Apr 17, 2007
Advanced Micro Devices, Inc.
Akram Ali Salman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Determination of device failure characteristic
Patent number
7,155,359
Issue date
Dec 26, 2006
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G01 - MEASURING TESTING
Information
Patent Grant
Structure and method for increasing accuracy in predicting hot carr...
Patent number
6,798,230
Issue date
Sep 28, 2004
Advanced Micro Devices, Inc.
Kurt Taylor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Testing system and method of operation therefor including a test fi...
Patent number
6,762,613
Issue date
Jul 13, 2004
Advanced Micro Devices, Inc.
Huade Walter Yao
G01 - MEASURING TESTING
Information
Patent Grant
Method of providing a frontside contact to a substrate of SOI device
Patent number
6,514,802
Issue date
Feb 4, 2003
Advanced Micro Devices, Inc.
Todd P. Lukanc
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Variable design rule tool
Patent number
6,516,450
Issue date
Feb 4, 2003
Advanced Micro Devices, Inc.
Wiley Eugene Hill
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Edge seal ring for copper damascene process and method for fabricat...
Patent number
6,362,524
Issue date
Mar 26, 2002
Advanced Micro Devices, Inc.
Richard C. Blish
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of providing a frontside contact to substrate of SOI device
Patent number
6,355,511
Issue date
Mar 12, 2002
Advanced Micro Devices, Inc.
Todd P. Lukanc
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Method of providing a frontside contact to a substrate of SOI device
Publication number
20020094666
Publication date
Jul 18, 2002
Todd P. Lukanc
H01 - BASIC ELECTRIC ELEMENTS