Kurt U. Neugebauer

Person

Vaterstetten, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with non-isolated power transistor with integr...
- Patent number 10,032,904
- Issue date Jul 24, 2018
- NXP USA, INC.
- Patrice M. Parris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked protection devices with overshoot protection and related fa...
- Patent number 9,620,496
- Issue date Apr 11, 2017
- NXP USA, INC.
- Weize Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with non-isolated power transistor with integr...
- Patent number 9,559,097
- Issue date Jan 31, 2017
- NXP USA, INC.
- Patrice M. Parris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip damage detection device for a semiconductor integrated circuit
- Patent number 9,157,955
- Issue date Oct 13, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Erwan Hemon
- G01 - MEASURING TESTING
Information Patent Grant
Integrated protection circuit
- Patent number 8,681,459
- Issue date Mar 25, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Kurt Neugebauer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURE AND METHOD FOR TEST-POINT ACCESS IN A SEMICONDUCTOR
- Publication number 20240047281
- Publication date Feb 8, 2024
- NXP USA, Inc.
- Kristofor Jason Dickson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device with Non-Isolated Power Transistor with Integr...
- Publication number 20170092760
- Publication date Mar 30, 2017
- NXP USA, Inc.
- Patrice M. Parris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STACKED PROTECTION DEVICES WITH OVERSHOOT PROTECTION AND RELATED FA...
- Publication number 20160268245
- Publication date Sep 15, 2016
- WEIZE CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH NON-ISOLATED POWER TRANSISTOR WITH INTEGR...
- Publication number 20160099349
- Publication date Apr 7, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Patrice M. Parris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHIP DAMAGE DETECTION DEVICE FOR A SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20120286269
- Publication date Nov 15, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Erwan Hemon
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED PROTECTION CIRCUIT
- Publication number 20120039009
- Publication date Feb 16, 2012
- Freescale Semiconductor Inc.
- Kurt Neugebauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAULT DETECTION APPARATUS FOR ALPHANUMERIC DISPLAY SYSTEM AND METHO...
- Publication number 20110109602
- Publication date May 12, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Kurt Neugebauer
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Kurt U. Neugebauer

Person

Patents Grantslast 30 patents

Semiconductor device with non-isolated power transistor with integr...

Stacked protection devices with overshoot protection and related fa...

Semiconductor device with non-isolated power transistor with integr...

Chip damage detection device for a semiconductor integrated circuit

Integrated protection circuit

Patents Applicationslast 30 patents

STRUCTURE AND METHOD FOR TEST-POINT ACCESS IN A SEMICONDUCTOR

Semiconductor Device with Non-Isolated Power Transistor with Integr...

STACKED PROTECTION DEVICES WITH OVERSHOOT PROTECTION AND RELATED FA...

SEMICONDUCTOR DEVICE WITH NON-ISOLATED POWER TRANSISTOR WITH INTEGR...

CHIP DAMAGE DETECTION DEVICE FOR A SEMICONDUCTOR INTEGRATED CIRCUIT

INTEGRATED PROTECTION CIRCUIT

FAULT DETECTION APPARATUS FOR ALPHANUMERIC DISPLAY SYSTEM AND METHO...