Kurt W. Larson

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Cedar Crest, NM, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for simultaneous modification of multiple semiconductor devi...
- Patent number 10,217,704
- Issue date Feb 26, 2019
- National Technology & Engineering Solutions of Sandia, LLC
- Randy J. Shul
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sparse sampling and reconstruction for electron and scanning probe...
- Patent number 9,093,249
- Issue date Jul 28, 2015
- Sandia Corporation
- Hyrum Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast electron microscopy via compressive sensing
- Patent number 8,907,280
- Issue date Dec 9, 2014
- Sandia Corporation
- Kurt W. Larson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPARSE SAMPLING AND RECONSTRUCTION FOR ELECTRON AND SCANNING PROBE...
- Publication number 20150069233
- Publication date Mar 12, 2015
- SANDIA CORPORATION
- Hyrum Anderson
- H01 - BASIC ELECTRIC ELEMENTS