Kushagra Sinha

Person

Wappingers Falls, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for accurate pad contact testing
- Patent number 12,188,961
- Issue date Jan 7, 2025
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Localized heating/cooling using thermocouple between probe pins
- Patent number 11,796,590
- Issue date Oct 24, 2023
- International Business Machines Corporation
- Pablo Nieves
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device test pad probe card structure with individual probe manipula...
- Patent number 11,137,418
- Issue date Oct 5, 2021
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Test probe assembly with fiber optic leads and photodetectors
- Patent number 11,125,780
- Issue date Sep 21, 2021
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Test probe assembly with fiber optic leads and photodetectors for t...
- Patent number 11,119,148
- Issue date Sep 14, 2021
- International Business Machines Corporation
- Pablo Nieves
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ACCURATE PAD CONTACT TESTING
- Publication number 20240036074
- Publication date Feb 1, 2024
- International Business Machines Corporation
- KUSHAGRA SINHA
- G01 - MEASURING TESTING
Information Patent Application
LOCALIZED MAGNETIC FIELD TESTING
- Publication number 20230176115
- Publication date Jun 8, 2023
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Application
LOCALIZED HEATING/COOLING USING THERMOCOUPLE BETWEEN PROBE PINS
- Publication number 20230168297
- Publication date Jun 1, 2023
- International Business Machines Corporation
- Pablo Nieves
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE TEST PAD PROBE CARD STRUCTURE WITH INDIVIDUAL PROBE MANIPULA...
- Publication number 20200284823
- Publication date Sep 10, 2020
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHODOLOGY FOR HIGH INTENSITY TEST PROBE ALIGNMENT T...
- Publication number 20200124663
- Publication date Apr 23, 2020
- International Business Machines Corporation
- Pablo Nieves
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
STRUCTURE AND METHODOLOGY FOR DETERMINING TEST PAD INTEGRITY
- Publication number 20200124638
- Publication date Apr 23, 2020
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING

Kushagra Sinha

Person

Patents Grantslast 30 patents

Method for accurate pad contact testing

Localized heating/cooling using thermocouple between probe pins

Device test pad probe card structure with individual probe manipula...

Test probe assembly with fiber optic leads and photodetectors

Test probe assembly with fiber optic leads and photodetectors for t...

Patents Applicationslast 30 patents

METHOD FOR ACCURATE PAD CONTACT TESTING

LOCALIZED MAGNETIC FIELD TESTING

LOCALIZED HEATING/COOLING USING THERMOCOUPLE BETWEEN PROBE PINS

DEVICE TEST PAD PROBE CARD STRUCTURE WITH INDIVIDUAL PROBE MANIPULA...

STRUCTURE AND METHODOLOGY FOR HIGH INTENSITY TEST PROBE ALIGNMENT T...

STRUCTURE AND METHODOLOGY FOR DETERMINING TEST PAD INTEGRITY