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Kwang-Ho Ji
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Hwasung-si, KR
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last 30 patents
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Patent Grant
Apparatus for detecting particle
Patent number
8,228,503
Issue date
Jul 24, 2012
Samsung Electro-Mechanics Co., Ltd.
Taeg-Gyum Kim
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
APPARATUS FOR DETECTING PARTICLE
Publication number
20110242534
Publication date
Oct 6, 2011
Samsung Electro-Mechanics CO., LTD.
Taeg-Gyum KIM
G01 - MEASURING TESTING