Kwang-Ting Cheng

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Edison, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and integrated circuit adapted for partial scan testability
- Patent number 5,710,711
- Issue date Jan 20, 1998
- Lucent Technologies Inc.
- Kwang-Ting Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Testing a sequential circuit
- Patent number 5,590,135
- Issue date Dec 31, 1996
- Lucent Technologies Inc.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
Cost-function directed search method for generating tests for seque...
- Patent number 5,257,268
- Issue date Oct 26, 1993
- AT&T Bell Laboratories
- Prathima Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Testable implementations of finite state machines and methods for p...
- Patent number 5,228,040
- Issue date Jul 13, 1993
- AT&T Bell Laboratories
- Vishwani D. Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Method and integrated circuit adapted for partial scan testability
- Patent number 5,043,986
- Issue date Aug 27, 1991
- AT&T Bell Laboratories
- Vishwani D. Agrawal
- G01 - MEASURING TESTING