Kwangeun KIM

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and test method thereof
- Patent number 12,092,656
- Issue date Sep 17, 2024
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection device and method of manufacturing semiconductor d...
- Patent number 11,428,645
- Issue date Aug 30, 2022
- Samsung Electronics Co., Ltd.
- Kihak Nam
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20240385220
- Publication date Nov 21, 2024
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE IMAGE DISTORTION CORRECTION METHOD, AN...
- Publication number 20240242317
- Publication date Jul 18, 2024
- Samsung Electronics Co., Ltd.
- Minsu KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING TH...
- Publication number 20240192154
- Publication date Jun 13, 2024
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...
- Publication number 20230194567
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD O...
- Publication number 20230140892
- Publication date May 11, 2023
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS AND TEST METHOD THEREOF
- Publication number 20220404395
- Publication date Dec 22, 2022
- Korea Advanced Institute of Science and Technology
- Sungyoon RYU
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR D...
- Publication number 20210247328
- Publication date Aug 12, 2021
- Samsung Electronics Co., Ltd.
- Kihak NAM
- H01 - BASIC ELECTRIC ELEMENTS

Kwangeun KIM

Person

Patents Grantslast 30 patents

Test apparatus and test method thereof

Wafer inspection device and method of manufacturing semiconductor d...

Patents Applicationslast 30 patents

TEST APPARATUS AND TEST METHOD THEREOF

SCANNING ELECTRON MICROSCOPE IMAGE DISTORTION CORRECTION METHOD, AN...

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING TH...

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF M...

METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD O...

TEST APPARATUS AND TEST METHOD THEREOF

WAFER INSPECTION DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR D...