Kwangkyu BANG

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Module substrate for semiconductor module, semiconductor module and...
- Patent number 12,130,306
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G01 - MEASURING TESTING
Information Patent Grant
Test socket for performing a test on an electronic device
- Patent number 12,038,473
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Kiljoong Yun
- G01 - MEASURING TESTING
Information Patent Grant
Storage device testing module
- Patent number 12,019,485
- Issue date Jun 25, 2024
- Samsung Electronics Co., Ltd.
- Yun Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Module substrate and semiconductor module including the same
- Patent number 11,792,921
- Issue date Oct 17, 2023
- Samsung Electronics Co., Ltd.
- Sunki Yun
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of operating storage device for improving reliability, stora...
- Patent number 11,593,242
- Issue date Feb 28, 2023
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Module substrate and semiconductor module including the same
- Patent number 11,490,509
- Issue date Nov 1, 2022
- Samsung Electronics Co., Ltd.
- Sunki Yun
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Operating method of memory controller, storage device including the...
- Patent number 10,713,105
- Issue date Jul 14, 2020
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storage devices including dynamic internal thermal throttling
- Patent number 10,175,667
- Issue date Jan 8, 2019
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI CONNECTOR GRIP AND STORAGE DEVICE TEST SYSTEM INCLUDING THE SAME
- Publication number 20250029637
- Publication date Jan 23, 2025
- Samsung Electronics Co., Ltd.
- Sanggeun YOO
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC SYSTEM AND METHOD OF MANAGING ERRORS OF THE SAME
- Publication number 20250021426
- Publication date Jan 16, 2025
- Samsung Electronics Co., Ltd.
- Hwajeong Kwon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULE SUBSTRATE FOR SEMICONDUCTOR MODULE, SEMICONDUCTOR MODULE AND...
- Publication number 20230213554
- Publication date Jul 6, 2023
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE
- Publication number 20230098635
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Kiljoong YUN
- G01 - MEASURING TESTING
Information Patent Application
STORAGE DEVICE TESTING MODULE
- Publication number 20230087045
- Publication date Mar 23, 2023
- Samsung Electronics Co., Ltd.
- YUN CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULE SUBSTRATE AND SEMICONDUCTOR MODULE INCLUDING THE SAME
- Publication number 20220418097
- Publication date Dec 29, 2022
- Samsung Electronics Co., Ltd.
- Sunki YUN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
STORAGE SYSTEM, STORAGE DEVICE, AND OPERATION METHOD OF STORAGE DEVICE
- Publication number 20220326284
- Publication date Oct 13, 2022
- Samsung Electronics Co., Ltd.
- JIHONG KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULE SUBSTRATE AND SEMICONDUCTOR MODULE INCLUDING THE SAME
- Publication number 20220124904
- Publication date Apr 21, 2022
- Samsung Electronics Co., Ltd.
- Sunki YUN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD OF OPERATING STORAGE DEVICE FOR IMPROVING RELIABILITY, STORA...
- Publication number 20210049086
- Publication date Feb 18, 2021
- Samsung Electronics Co., Ltd.
- KWANGKYU BANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPERATING METHOD OF MEMORY CONTROLLER, STORAGE DEVICE INCLUDING THE...
- Publication number 20190079816
- Publication date Mar 14, 2019
- Samsung Electronics Co., Ltd.
- KWANGKYU BANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE DEVICES INCLUDING DYNAMIC INTERNAL THERMAL THROTTLING
- Publication number 20170052551
- Publication date Feb 23, 2017
- Samsung Electronics Co., Ltd.
- Kwangkyu BANG
- G06 - COMPUTING CALCULATING COUNTING

Kwangkyu BANG

Person

Patents Grantslast 30 patents

Module substrate for semiconductor module, semiconductor module and...

Test socket for performing a test on an electronic device

Storage device testing module

Module substrate and semiconductor module including the same

Method of operating storage device for improving reliability, stora...

Module substrate and semiconductor module including the same

Operating method of memory controller, storage device including the...

Storage devices including dynamic internal thermal throttling

Patents Applicationslast 30 patents

MULTI CONNECTOR GRIP AND STORAGE DEVICE TEST SYSTEM INCLUDING THE SAME

ELECTRONIC SYSTEM AND METHOD OF MANAGING ERRORS OF THE SAME

MODULE SUBSTRATE FOR SEMICONDUCTOR MODULE, SEMICONDUCTOR MODULE AND...

TEST SOCKET FOR PERFORMING A TEST ON AN ELECTRONIC DEVICE

STORAGE DEVICE TESTING MODULE

MODULE SUBSTRATE AND SEMICONDUCTOR MODULE INCLUDING THE SAME

STORAGE SYSTEM, STORAGE DEVICE, AND OPERATION METHOD OF STORAGE DEVICE

MODULE SUBSTRATE AND SEMICONDUCTOR MODULE INCLUDING THE SAME

METHOD OF OPERATING STORAGE DEVICE FOR IMPROVING RELIABILITY, STORA...

OPERATING METHOD OF MEMORY CONTROLLER, STORAGE DEVICE INCLUDING THE...

STORAGE DEVICES INCLUDING DYNAMIC INTERNAL THERMAL THROTTLING