Kwangrak Kim

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Gunpo-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method using same
- Patent number 11,946,881
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectroscopic measuring apparatus and method, and method for fabric...
- Patent number 11,320,259
- Issue date May 3, 2022
- Samsung Electronics Co., Ltd.
- Kwangrak Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MANUFACTURING DEVICE AND CONTROL OF THE SAME
- Publication number 20240412407
- Publication date Dec 12, 2024
- Samsung Electronics Co., Ltd.
- Junghee Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE ANALYSIS SYSTEM
- Publication number 20240112881
- Publication date Apr 4, 2024
- Samsung Electronics Co., Ltd.
- Jonghyeok PARK
- G01 - MEASURING TESTING
Information Patent Application
FOCUS CONTROL METHOD FOR SPECTROSCOPIC MEASURING APPARATUS, INSPECT...
- Publication number 20240060907
- Publication date Feb 22, 2024
- Samsung Electronics Co., Ltd.
- Youngsun Choi
- G02 - OPTICS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD USING SAME
- Publication number 20220412898
- Publication date Dec 29, 2022
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TRAINING DEEP LEARNING MODEL FOR PREDICTING PATTERN CHARA...
- Publication number 20220121956
- Publication date Apr 21, 2022
- Samsung Electronics Co., Ltd.
- Yoonsung BAE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROSCOPIC MEASURING APPARATUS AND METHOD, AND METHOD FOR FABRIC...
- Publication number 20220049949
- Publication date Feb 17, 2022
- Samsung Electronics Co., Ltd.
- Kwangrak Kim
- H01 - BASIC ELECTRIC ELEMENTS