Kwangsoo KIM

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Pyeongtaek-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Through-focus image-based metrology device, operation method thereo...
- Patent number 11,988,495
- Issue date May 21, 2024
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Vertical memory devices
- Patent number 11,158,651
- Issue date Oct 26, 2021
- Samsung Electronics Co., Ltd.
- Kyunghwan Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and semiconductor structure-manufacturing appa...
- Patent number 10,699,927
- Issue date Jun 30, 2020
- Samsung Electronics Co., Ltd.
- Wookrae Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL METROLOGY DEVICE
- Publication number 20240412350
- Publication date Dec 12, 2024
- Samsung Electronics Co., Ltd.
- Minsu Jo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THROUGH-FOCUS IMAGE-BASED METROLOGY DEVICE, OPERATION METHOD THEREO...
- Publication number 20210396510
- Publication date Dec 23, 2021
- Samsung Electronics Co., Ltd.
- Kwangsoo Kim
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL MEMORY DEVICES
- Publication number 20200388632
- Publication date Dec 10, 2020
- Samsung Electronics Co., Ltd.
- KYUNGHWAN LEE
- G11 - INFORMATION STORAGE
Information Patent Application
INSPECTION APPARATUS AND SEMICONDUCTOR STRUCTURE-MANUFACTURING APPA...
- Publication number 20200185240
- Publication date Jun 11, 2020
- Samsung Electronics Co., Ltd.
- Wookrae KIM
- G01 - MEASURING TESTING