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Patents Grants
last 30 patents
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Patent Grant
Thickness estimation method and processing control method
Patent number
11,668,558
Issue date
Jun 6, 2023
Samsung Electronics Co., Ltd.
Jongsu Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer inspection apparatus and method
Patent number
11,579,096
Issue date
Feb 14, 2023
Samsung Electronics Co., Ltd.
Sungha Kim
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
WAFER POLISHING APPARATUS AND METHOD OF DETECTING DEFECT OF RETAINE...
Publication number
20230166299
Publication date
Jun 1, 2023
Samsung Electronics Co., Ltd.
Jongsu KIM
B08 - CLEANING
Information
Patent Application
THICKNESS ESTIMATION METHOD AND PROCESSING CONTROL METHOD
Publication number
20220065618
Publication date
Mar 3, 2022
Samsung Electronics Co., Ltd.
Jongsu Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAFER INSPECTION APPARATUS AND METHOD
Publication number
20210341396
Publication date
Nov 4, 2021
Samsung Electronics Co., Ltd.
Sungha KIM
G01 - MEASURING TESTING
Information
Patent Application
POLISHING PAD-MEASURING APPARATUS AND CHEMICAL MECHANICAL POLISHING...
Publication number
20170291278
Publication date
Oct 12, 2017
Samsung Electronics Co., Ltd.
Kwangsung LEE
G01 - MEASURING TESTING