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Kyo Suda
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Hachioji, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Laser length measuring instrument
Patent number
5,123,742
Issue date
Jun 23, 1992
Hitachi Electronics Engineering Co., Ltd.
Hideo Takizawa
G01 - MEASURING TESTING
Information
Patent Grant
Pattern defect inspection apparatus
Patent number
4,731,855
Issue date
Mar 15, 1988
Hitachi, Ltd.
Kyo Suda
G01 - MEASURING TESTING
Information
Patent Grant
Small particle detection system
Patent number
4,685,802
Issue date
Aug 11, 1987
Hitachi, Ltd.
Susumu Saito
G01 - MEASURING TESTING
Information
Patent Grant
Light beam scanning apparatus and the method
Patent number
4,464,011
Issue date
Aug 7, 1984
Hitachi, Ltd.
Kensaku Takahashi
G02 - OPTICS