Kyoho Lee

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Registers for post configuration testing of programmable logic devices
- Patent number 9,575,123
- Issue date Feb 21, 2017
- Lattice Semiconductor Corporation
- Pradeep Lenka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REGISTERS FOR POST CONFIGURATION TESTING OF PROGRAMMABLE LOGIC DEVICES
- Publication number 20160216330
- Publication date Jul 28, 2016
- Lattice Semiconductor Corporation
- Pradeep Lenka
- G01 - MEASURING TESTING