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Kyoji SHIBUYA
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Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Analysis device
Patent number
12,111,255
Issue date
Oct 8, 2024
Horiba, Ltd.
Kyoji Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzing apparatus
Patent number
12,111,254
Issue date
Oct 8, 2024
Horiba, Ltd.
Takahito Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device, program for an analysis device and analysis method
Patent number
11,030,423
Issue date
Jun 8, 2021
Horiba, Ltd.
Kyoji Shibuya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Analysis apparatus and analysis method
Patent number
10,935,489
Issue date
Mar 2, 2021
Horiba, Ltd.
Kyoji Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device
Patent number
10,788,415
Issue date
Sep 29, 2020
Horiba Ltd.
Kyoji Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Analysis apparatus, program for analysis apparatus, and analysis me...
Patent number
10,605,726
Issue date
Mar 31, 2020
Horiba, Ltd.
Kyoji Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Multipass cell, gas analyzer, and method for manufacturing mirror f...
Patent number
10,551,299
Issue date
Feb 4, 2020
Horiba, Ltd.
Kyoji Shibuya
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
Publication number
20240418637
Publication date
Dec 19, 2024
HORIBA, LTD.
Takaaki HANADA
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYSIS DEVICE AND LASER LIGHT TRANSMISSION MECHANISM
Publication number
20240201078
Publication date
Jun 20, 2024
Horiba Stec, Co., Ltd.
Motonobu TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYSIS DEVICE AND GAS ANALYSIS METHOD
Publication number
20230417660
Publication date
Dec 28, 2023
Horiba Stec, Co., Ltd.
Yuhei SAKAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS DEVICE, PROGRAM FOR ANALYSIS DEVICE, AND ANALYSIS METHOD
Publication number
20230204498
Publication date
Jun 29, 2023
HORIBA, LTD.
Kyoji SHIBUYA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZING APPARATUS
Publication number
20220244176
Publication date
Aug 4, 2022
HORIBA, LTD.
Takahito INOUE
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS DEVICE
Publication number
20220236180
Publication date
Jul 28, 2022
Horiba, Ltd.
Kyoji SHIBUYA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS DEVICE, PROGRAM FOR AN ANALYSIS DEVICE AND ANALYSIS METHOD
Publication number
20200210651
Publication date
Jul 2, 2020
Horiba, Ltd.
Kyoji SHIBUYA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ANALYSIS DEVICE
Publication number
20190113442
Publication date
Apr 18, 2019
Horiba, Ltd.
Kyoji SHIBUYA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS APPARATUS AND ANALYSIS METHOD
Publication number
20190101491
Publication date
Apr 4, 2019
Horiba, Ltd.
Kyoji SHIBUYA
G01 - MEASURING TESTING
Information
Patent Application
MULTIPASS CELL, GAS ANALYZER, AND METHOD FOR MANUFACTURING MIRROR F...
Publication number
20190101487
Publication date
Apr 4, 2019
Horiba, Ltd.
Kyoji SHIBUYA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS APPARATUS, PROGRAM FOR ANALYSIS APPARATUS, AND ANALYSIS ME...
Publication number
20180172581
Publication date
Jun 21, 2018
Horiba, Ltd.
Kyoji SHIBUYA
G01 - MEASURING TESTING