Kyoji Yamashita

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection apparatus, pattern inspection method, and comput...
- Patent number 8,260,031
- Issue date Sep 4, 2012
- Kabushiki Kaisha Toshiba
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus, corrected image generation method, an...
- Patent number 8,233,698
- Issue date Jul 31, 2012
- Kabushiki Kaisha Toshiba
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus, image alignment method, displacement...
- Patent number 7,809,181
- Issue date Oct 5, 2010
- Advanced Mask Inspection Technology Inc.
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Target workpiece inspection apparatus, image alignment method, and...
- Patent number 7,655,904
- Issue date Feb 2, 2010
- Advanced Mask Inspection Technology Inc.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection apparatus, image alignment method, and program-re...
- Patent number 7,577,288
- Issue date Aug 18, 2009
- Advanced Mask Inspection Technology Inc.
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,551,767
- Issue date Jun 23, 2009
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data searching system, method of synchronizing metadata and data se...
- Patent number 7,519,593
- Issue date Apr 14, 2009
- Kabushiki Kaisha Toshiba
- Kazuko Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,421,109
- Issue date Sep 2, 2008
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,415,149
- Issue date Aug 19, 2008
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,209,584
- Issue date Apr 24, 2007
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus
- Patent number 7,032,208
- Issue date Apr 18, 2006
- Kabushiki Kaisha Toshiba
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 6,883,160
- Issue date Apr 19, 2005
- Kabushiki Kaisha Toshiba
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection apparatus
- Patent number 6,396,943
- Issue date May 28, 2002
- Kabushiki Kaisha Toshiba
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical substrate inspection apparatus
- Patent number 6,084,716
- Issue date Jul 4, 2000
- Kabushiki Kaisha Toshiba
- Yasushi Sanada
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for generating two-dimensional circuit pattern
- Patent number 5,844,809
- Issue date Dec 1, 1998
- Kabushiki Kaisha Toshiba
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for generating a bit pattern
- Patent number 5,404,410
- Issue date Apr 4, 1995
- Kabushiki Kaisha Toshiba
- Toru Tojo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical pattern inspection system
- Patent number 5,185,812
- Issue date Feb 9, 1993
- Kabushiki Kaisha Toshiba
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for aligning two objects, and method and appar...
- Patent number 5,100,234
- Issue date Mar 31, 1992
- Kabushiki Kaisha Toshiba
- Yoriyuki Ishibashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for aligning two objects, and method and appar...
- Patent number 4,988,197
- Issue date Jan 29, 1991
- Kabushiki Kaisha Toshiba
- Yoriyuki Ishibashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20140043467
- Publication date Feb 13, 2014
- Kabushiki Kaisha Toshiba
- Kyoji YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS, PATTERN INSPECTION METHOD, AND COMPUT...
- Publication number 20090238441
- Publication date Sep 24, 2009
- Advanced Mask Inspection Technology, Inc.
- Kyoji YAMASHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS, CORRECTED IMAGE GENERATION METHOD, AN...
- Publication number 20080260234
- Publication date Oct 23, 2008
- Advanced Mask Inspection Technology
- Kyoji YAMASHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS
- Publication number 20080166054
- Publication date Jul 10, 2008
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TARGET WORKPIECE INSPECTION APPARATUS, IMAGE ALIGNMENT METHOD, AND...
- Publication number 20080036899
- Publication date Feb 14, 2008
- Advanced Mask Inspection Technology Inc.
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS, IMAGE ALIGNMENT METHOD, DISPLACEMENT...
- Publication number 20080037860
- Publication date Feb 14, 2008
- Advanced Mask Inspection Technology Inc.
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS
- Publication number 20070127806
- Publication date Jun 7, 2007
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA SEARCHING SYSTEM, METHOD OF SYNCHRONIZING METADATA AND DATA SE...
- Publication number 20070100807
- Publication date May 3, 2007
- KABUSHIKI KAISHA TOSHIBA
- Kazuko Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample inspection apparatus, image alignment method, and program-re...
- Publication number 20070053582
- Publication date Mar 8, 2007
- Advanced Mask Inspection Technology Inc.
- Kyoji Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus
- Publication number 20050172255
- Publication date Aug 4, 2005
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus
- Publication number 20040105578
- Publication date Jun 3, 2004
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect inspection apparatus
- Publication number 20030197857
- Publication date Oct 23, 2003
- Kyoji Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection apparatus
- Publication number 20030061594
- Publication date Mar 27, 2003
- Hideo Tsuchiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect inspection apparatus and method
- Publication number 20020051566
- Publication date May 2, 2002
- KABUSHIKI KAISHA TOSHIBA
- KYOJI YAMASHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS
- Publication number 20010055416
- Publication date Dec 27, 2001
- Kabushiki Kaisha Toshiba
- KYOJI YAMASHITA
- G06 - COMPUTING CALCULATING COUNTING

Kyoji Yamashita

Person

Patents Grantslast 30 patents

Pattern inspection apparatus, pattern inspection method, and comput...

Pattern inspection apparatus, corrected image generation method, an...

Pattern inspection apparatus, image alignment method, displacement...

Target workpiece inspection apparatus, image alignment method, and...

Sample inspection apparatus, image alignment method, and program-re...

Pattern inspection apparatus

Data searching system, method of synchronizing metadata and data se...

Pattern inspection apparatus

Pattern inspection apparatus

Pattern inspection apparatus

Defect inspection apparatus

Pattern inspection apparatus

Defect inspection method and defect inspection apparatus

Optical substrate inspection apparatus

Method and apparatus for generating two-dimensional circuit pattern

Method and system for generating a bit pattern

Optical pattern inspection system

Method and apparatus for aligning two objects, and method and appar...

Method and apparatus for aligning two objects, and method and appar...

Patents Applicationslast 30 patents

DEFECT INSPECTION APPARATUS

PATTERN INSPECTION APPARATUS, PATTERN INSPECTION METHOD, AND COMPUT...

PATTERN INSPECTION APPARATUS, CORRECTED IMAGE GENERATION METHOD, AN...

PATTERN INSPECTION APPARATUS

TARGET WORKPIECE INSPECTION APPARATUS, IMAGE ALIGNMENT METHOD, AND...

PATTERN INSPECTION APPARATUS, IMAGE ALIGNMENT METHOD, DISPLACEMENT...

PATTERN INSPECTION APPARATUS

DATA SEARCHING SYSTEM, METHOD OF SYNCHRONIZING METADATA AND DATA SE...

Sample inspection apparatus, image alignment method, and program-re...

Pattern inspection apparatus

Pattern inspection apparatus

Defect inspection apparatus

Pattern inspection apparatus

Defect inspection apparatus and method

DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS