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Kyoko Oniyama
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Lisle, IL, US
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Patents Grants
last 30 patents
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Patent Grant
Connector and semiconductor testing device including the connector
Patent number
8,860,454
Issue date
Oct 14, 2014
Advantest Corporation
Kyoko Oniyama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
CONNECTOR AND SEMICONDUCTOR TESTING DEVICE INCLUDING THE CONNECTOR
Publication number
20120126845
Publication date
May 24, 2012
Molex japan co., ltd.
Kyoko Oniyama
G01 - MEASURING TESTING