Kyong Hee JOO

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for clustering images
- Patent number 12,013,918
- Issue date Jun 18, 2024
- SAMSUNG SDS CO., LTD.
- Joo Yeon Chung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting defect pattern on wafer based on...
- Patent number 11,816,579
- Issue date Nov 14, 2023
- SAMSUNG SDS CO., LTD.
- Min Sik Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting defect pattern on wafer based on...
- Patent number 11,587,222
- Issue date Feb 21, 2023
- SAMSUNG SDS CO., LTD.
- Min Sik Chu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECT PATTERN ON WAFER BASED ON...
- Publication number 20230177347
- Publication date Jun 8, 2023
- SAMSUNG SDS CO., LTD.
- Min Sik CHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR CLUSTERING IMAGES
- Publication number 20220253641
- Publication date Aug 11, 2022
- SAMSUNG SDS CO., LTD.
- Joo Yeon CHUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECT PATTERN ON WAFER BASED ON...
- Publication number 20200380655
- Publication date Dec 3, 2020
- SAMSUNG SDS CO., LTD.
- Min Sik CHU
- G06 - COMPUTING CALCULATING COUNTING