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Kyoung-Il Heo

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  • ChoongChungNam-do, KR
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Patents Grantslast 30 patents

  • Information Patent Grant

    Multichip package test
    • Patent number 7,327,154
    • Issue date Feb 5, 2008
    • Samsung Electronics Co., Ltd.
    • Young-Gu Shin
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Multichip package test
    • Patent number 6,943,577
    • Issue date Sep 13, 2005
    • Samsung Electronics Co., Ltd.
    • Young-Gu Shin
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents