Kyozo FUJITA

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Akashi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample analyzer
- Patent number 10,837,976
- Issue date Nov 17, 2020
- Sysmex Corporation
- Hiroyuki Fujino
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample analyzer
- Patent number 10,101,348
- Issue date Oct 16, 2018
- Sysmex Corporation
- Hiroyuki Fujino
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample analyzer
- Patent number 9,297,818
- Issue date Mar 29, 2016
- Sysmex Corporation
- Kyozo Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Method of displaying a scattergram
- Patent number 6,181,319
- Issue date Jan 30, 2001
- Sysmex Corporation
- Kyozo Fujita
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE ANALYZER
- Publication number 20210063421
- Publication date Mar 4, 2021
- Sysmex Corporation
- Hiroyuki Fujino
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE ANALYZER
- Publication number 20190025335
- Publication date Jan 24, 2019
- Sysmex Corporation
- Hiroyuki Fujino
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE ANALYZER
- Publication number 20160274136
- Publication date Sep 22, 2016
- Sysmex Corporation
- Hiroyuki Fujino
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER
- Publication number 20150316569
- Publication date Nov 5, 2015
- Sysmex Corporation
- Kyozo FUJITA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER, SAMPLE CONTAINER FOR QUALITY CONTROL, QUALITY CONT...
- Publication number 20130316461
- Publication date Nov 28, 2013
- SYSMEX CORPORATION
- Kyozo FUJITA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS RESULT PROVIDING SYSTEM, SAMPLE ANALYZING SYSTEM, ANALYSIS...
- Publication number 20130260413
- Publication date Oct 3, 2013
- SYSMEX CORPORATION
- Naoto KOSHIMURA
- G01 - MEASURING TESTING