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Kyozo FUJITA

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  • Hamburg, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sample analyzer
    • Patent number 9,372,199
    • Issue date Jun 21, 2016
    • Sysmex Corporation
    • Hiroyuki Fujino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample analyzer and sample analyzing method
    • Patent number 8,920,722
    • Issue date Dec 30, 2014
    • Sysmex Corporation
    • Nobuhiro Kitagawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample analyzer
    • Patent number 8,329,101
    • Issue date Dec 11, 2012
    • Sysmex Corporation
    • Kyozo Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample analyzer
    • Patent number 8,163,239
    • Issue date Apr 24, 2012
    • Sysmex Corporation
    • Kyozo Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample analyzer
    • Patent number 7,931,863
    • Issue date Apr 26, 2011
    • SYSMEX CORPORATION
    • Nobuhiro Kitagawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample measurement device, measurement information display method,...
    • Patent number 7,769,565
    • Issue date Aug 3, 2010
    • Sysmex Corporation
    • Kyozo Fujita
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SAMPLE ANALYZER
    • Publication number 20120177535
    • Publication date Jul 12, 2012
    • Sysmex Corporation
    • Kyozo FUJITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample measurement device, measurement information display method,...
    • Publication number 20080071503
    • Publication date Mar 20, 2008
    • Kyozo Fujita
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample analyzer
    • Publication number 20080063570
    • Publication date Mar 13, 2008
    • Hiroyuki Fujino
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Sample analyzer
    • Publication number 20080050279
    • Publication date Feb 28, 2008
    • Kyozo Fujita
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample analyzer
    • Publication number 20080050280
    • Publication date Feb 28, 2008
    • Kyozo Fujita
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample analyzer and sample analyzing method
    • Publication number 20080011106
    • Publication date Jan 17, 2008
    • Nobuhiro Kitagawa
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Sample analyzer
    • Publication number 20080014118
    • Publication date Jan 17, 2008
    • Nobuhiro Kitagawa
    • G01 - MEASURING TESTING