Kyu-Baik Chang

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Wafer defect test apparatus, wafer defect test system, wafer test m...
- Patent number 12,282,317
- Issue date Apr 22, 2025
- Samsung Electronics Co., Ltd.
- Sung Hee Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of detecting stresses, methods of training compact models,...
- Patent number 9,798,849
- Issue date Oct 24, 2017
- SAMSUNG EELECTRONICS CO., LTD.
- Jae-Pil Shin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for executing unified process-device-circuit si...
- Patent number 9,235,664
- Issue date Jan 12, 2016
- Samsung Electronics Co., Ltd.
- Kyung Rok Kim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR GENERATING LEARNING MODEL FOR PREDICTING SEMICONDUCTOR D...
- Publication number 20240402619
- Publication date Dec 5, 2024
- Samsung Electronics Co., Ltd.
- Minkyu KIM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS OF DETECTING STRESSES, METHODS OF TRAINING COMPACT MODELS,...
- Publication number 20160012174
- Publication date Jan 14, 2016
- Jae-Pil SHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Executing Unified Process-Device-Circuit Si...
- Publication number 20100114553
- Publication date May 6, 2010
- Kyung Rok Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Simulation method of wafer warpage
- Publication number 20070087529
- Publication date Apr 19, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Won-Young Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Deposition apparatus
- Publication number 20060272561
- Publication date Dec 7, 2006
- Kyu-Baik Chang
- H01 - BASIC ELECTRIC ELEMENTS