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Kyungsook Lee
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Daejeon, KR
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Patents Grants
last 30 patents
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Patent Grant
Apparatus and method for manufacturing substrates
Patent number
10,823,779
Issue date
Nov 3, 2020
Samsung Electronics Co., Ltd.
Youngchul Lee
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for manufacturing substrates
Patent number
9,995,787
Issue date
Jun 12, 2018
Samsung Electronics Co., Ltd.
Youngchul Lee
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for manufacturing substrates
Patent number
9,285,416
Issue date
Mar 15, 2016
Samsung Electronics Co., Ltd.
Youngchul Lee
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES
Publication number
20180246164
Publication date
Aug 30, 2018
SEMES CO., LTD.
Youngchul Lee
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES
Publication number
20160154054
Publication date
Jun 2, 2016
Youngchul Lee
G01 - MEASURING TESTING
Information
Patent Application
FACILITY AND A METHOD FOR TESTING SEMICONDUCTOR DEVICES
Publication number
20140306727
Publication date
Oct 16, 2014
Samsung Electronics Co., Ltd.
Kyungsook Lee
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MANUFACTURING SUBSTRATES
Publication number
20130257471
Publication date
Oct 3, 2013
Youngchul Lee
G01 - MEASURING TESTING