Kyungwon Yun

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of training deep learning model for predicting pattern chara...
- Patent number 12,205,040
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Yoonsung Bae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a semiconductor processing chamber using a vis...
- Patent number 11,538,701
- Issue date Dec 27, 2022
- Samsung Electronics Co., Ltd.
- Taehyoung Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Super-resolution holographic microscope
- Patent number 11,428,947
- Issue date Aug 30, 2022
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method based on coherent diffraction imagi...
- Patent number 11,275,034
- Issue date Mar 15, 2022
- Samsung Electronics Co., Ltd.
- Kyungwon Yun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF TRAINING DEEP LEARNING MODEL FOR PREDICTING PATTERN CHARA...
- Publication number 20220121956
- Publication date Apr 21, 2022
- Samsung Electronics Co., Ltd.
- Yoonsung BAE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND METHOD BASED ON COHERENT DIFFRACTION IMAGI...
- Publication number 20210164919
- Publication date Jun 3, 2021
- Samsung Electronics Co., Ltd.
- Kyungwon Yun
- G01 - MEASURING TESTING
Information Patent Application
SUPER-RESOLUTION HOLOGRAPHIC MICROSCOPE
- Publication number 20210080743
- Publication date Mar 18, 2021
- Samsung Electronics Co., Ltd.
- Myungjun LEE
- G02 - OPTICS
Information Patent Application
Method of inspecting a semiconductor processing chamber using a vis...
- Publication number 20210013074
- Publication date Jan 14, 2021
- Samsung Electronics Co., Ltd.
- TAEHYOUNG LEE
- G06 - COMPUTING CALCULATING COUNTING