L. Owen Farnsworth, III

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Lincoln, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for optimizing a set of scan diagnostic patterns
- Patent number 6,996,791
- Issue date Feb 7, 2006
- International Business Machines Corporation
- Vanessa Brunkhorst
- G01 - MEASURING TESTING
Information Patent Grant
Internal cache for on chip test data storage
- Patent number 6,901,542
- Issue date May 31, 2005
- International Business Machines Corporation
- Thomas W. Bartenstein
- G11 - INFORMATION STORAGE