Lacroix Yves

Person

Tokushima, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Smart servo motor and actuator assembly using a plurality of smart...
- Patent number 11,641,399
- Issue date May 2, 2023
- RobotShop Japan Co., Ltd.
- Yves Lacroix
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for measuring surface profile
- Patent number 10,283,419
- Issue date May 7, 2019
- YSYSTEMS, LTD.
- Yves Lacroix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring temperature of semiconductor layer
- Patent number 9,823,132
- Issue date Nov 21, 2017
- YSYSTEMS, LTD.
- Yves Lacroix
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for measuring a luminescent decay
- Patent number 9,029,801
- Issue date May 12, 2015
- YSystems, Ltd.
- Lacroix Yves
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring temperature during deposition of se...
- Patent number 8,673,656
- Issue date Mar 18, 2014
- YSystems, Ltd.
- Lacroix Yves
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for roughening semiconductor surface
- Patent number 6,884,647
- Issue date Apr 26, 2005
- Nitride Semiconductors Co., Ltd.
- Shiro Sakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing nitride compound based semiconductor devic...
- Patent number 6,610,606
- Issue date Aug 26, 2003
- Nitride Semiconductors Co., Ltd.
- Shiro Sakai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SMART SERVO MOTOR AND ACTUATOR ASSEMBLY USING A PLURALITY OF SMART...
- Publication number 20210360069
- Publication date Nov 18, 2021
- RobotShop Japan Co., Ltd.
- Yves Lacroix
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR MEASURING SURFACE PROFILE
- Publication number 20170221776
- Publication date Aug 3, 2017
- YSYSTEMS, LTD.
- Yves LACROIX
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Measuring Temperature of Semiconductor Layer
- Publication number 20140192839
- Publication date Jul 10, 2014
- YSYSTEMS, LTD.
- Yves Lacroix
- C30 - CRYSTAL GROWTH
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A LUMINESCENT DECAY
- Publication number 20130140431
- Publication date Jun 6, 2013
- YSystems Ltd.
- Lacroix Yves
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING TEMPERATURE DURING DEPOSITION OF SE...
- Publication number 20110312107
- Publication date Dec 22, 2011
- YSystems Ltd.
- Lacroix Yves
- C30 - CRYSTAL GROWTH
Information Patent Application
Nitride semiconductor chip and method for manufacturing nitride sem...
- Publication number 20060040500
- Publication date Feb 23, 2006
- Shiro Sakai
- Shiro Sakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for roughening semiconductor surface
- Publication number 20030181057
- Publication date Sep 25, 2003
- Shiro Sakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nitride compound based semiconductor device and manufacturing metho...
- Publication number 20020142563
- Publication date Oct 3, 2002
- Shiro Sakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nitride semiconductor chip and method for manufacturing nitride sem...
- Publication number 20020124794
- Publication date Sep 12, 2002
- Shiro Sakai
- H01 - BASIC ELECTRIC ELEMENTS

Lacroix Yves

Person

Patents Grantslast 30 patents

Smart servo motor and actuator assembly using a plurality of smart...

Method and apparatus for measuring surface profile

Method and apparatus for measuring temperature of semiconductor layer

Apparatus and method for measuring a luminescent decay

Method and device for measuring temperature during deposition of se...

Method for roughening semiconductor surface

Method for manufacturing nitride compound based semiconductor devic...

Patents Applicationslast 30 patents

SMART SERVO MOTOR AND ACTUATOR ASSEMBLY USING A PLURALITY OF SMART...

METHOD AND APPARATUS FOR MEASURING SURFACE PROFILE

Method and Apparatus for Measuring Temperature of Semiconductor Layer

APPARATUS AND METHOD FOR MEASURING A LUMINESCENT DECAY

METHOD AND DEVICE FOR MEASURING TEMPERATURE DURING DEPOSITION OF SE...

Nitride semiconductor chip and method for manufacturing nitride sem...

Method for roughening semiconductor surface

Nitride compound based semiconductor device and manufacturing metho...

Nitride semiconductor chip and method for manufacturing nitride sem...