TREA

Ladd T. Johnson

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  • Scotts Valley, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Testing circuits on substrate
    • Patent number 7,453,260
    • Issue date Nov 18, 2008
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrate
    • Patent number 7,259,548
    • Issue date Aug 21, 2007
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrates
    • Patent number 7,180,284
    • Issue date Feb 20, 2007
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrates
    • Patent number 7,098,649
    • Issue date Aug 29, 2006
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrates
    • Patent number 7,002,337
    • Issue date Feb 21, 2006
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrates
    • Patent number 6,861,859
    • Issue date Mar 1, 2005
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrate
    • Patent number 6,781,394
    • Issue date Aug 24, 2004
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing circuits on substrates
    • Patent number 6,771,060
    • Issue date Aug 3, 2004
    • Electroglas, Inc.
    • Timothy J. Boyle
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Testing circuits on substrate
    • Publication number 20060261833
    • Publication date Nov 23, 2006
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Application

    Testing circuits on substrates
    • Publication number 20060119346
    • Publication date Jun 8, 2006
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Application

    Testing circuits on substrate
    • Publication number 20050116731
    • Publication date Jun 2, 2005
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Application

    Testing circuits on substrates
    • Publication number 20040263153
    • Publication date Dec 30, 2004
    • Timothy J. Boyle
    • G01 - MEASURING TESTING
  • Information Patent Application

    Testing circuits on substrates
    • Publication number 20040232928
    • Publication date Nov 25, 2004
    • Timothy J. Boyle
    • G01 - MEASURING TESTING