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Laiq Chughtai
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Fremont, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Functional failure analysis techniques for programmable integrated...
Patent number
7,685,485
Issue date
Mar 23, 2010
Altera Corporation
Binh Vo
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for monitoring yield of integrated circuits
Patent number
7,212,032
Issue date
May 1, 2007
Altera Corporation
Jayabrata Ghosh Dastidar
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Functional failure analysis techniques for programmable integrated...
Publication number
20050022085
Publication date
Jan 27, 2005
Altera Corporation
Binh Vo
G01 - MEASURING TESTING