Lakshman Srinivasan

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for characterizing defects on semiconductor wafers
- Patent number 5,808,735
- Issue date Sep 15, 1998
- Ultrapointe Corporation
- Ken K. Lee
- G02 - OPTICS
Information Patent Grant
Method of establishing thresholds for image comparison
- Patent number 5,798,830
- Issue date Aug 25, 1998
- Ultrapointe Corporation
- Lakshman Srinivasan
- G02 - OPTICS