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Lakshmi Namburi
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Baldwin Park, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Fine pitch probes for semiconductor testing, and a method to fabric...
Patent number
9,194,887
Issue date
Nov 24, 2015
Advantest America, Inc
Florent Cros
G01 - MEASURING TESTING
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Patent Grant
Fine pitch probes for semiconductor testing, and a method to fabric...
Patent number
9,000,793
Issue date
Apr 7, 2015
Advantest America, Inc
Florent Cros
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
FINE PITCH PROBES FOR SEMICONDUCTOR TESTING, AND A METHOD TO FABRIC...
Publication number
20140132298
Publication date
May 15, 2014
ADVANTEST AMERICA, INC.
Florent Cros
G01 - MEASURING TESTING
Information
Patent Application
FINE PITCH PROBES FOR SEMICONDUCTOR TESTING, AND A METHOD TO FABRIC...
Publication number
20140132300
Publication date
May 15, 2014
ADVANTEST AMERICA, INC.
Florent Cros
G01 - MEASURING TESTING