Lakshmikanth NAMBURI

Follow

Person

Arcadia, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Transferring electronic probe assemblies to space transformers
- Patent number 10,859,602
- Issue date Dec 8, 2020
- Lakshmikanth Namburi
- G01 - MEASURING TESTING
Information Patent Grant
Low overdrive probes with high overdrive substrate
- Patent number 9,599,665
- Issue date Mar 21, 2017
- Advantest Corporation
- Ting Hu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for massively parallel multi-wafer test
- Patent number 9,335,347
- Issue date May 10, 2016
- Advantest Corporation
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Grant
Laterally driven probes for semiconductor testing
- Patent number 9,250,290
- Issue date Feb 2, 2016
- Advantest Corporation
- Lakshmikanth Namburi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LOW OVERDRIVE PROBES WITH HIGH OVERDRIVE SUBSTRATE
- Publication number 20140347084
- Publication date Nov 27, 2014
- Advantest Corporation
- Ting HU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST
- Publication number 20140070828
- Publication date Mar 13, 2014
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Application
LATERALLY DRIVEN PROBES FOR SEMICONDUCTOR TESTING
- Publication number 20130285688
- Publication date Oct 31, 2013
- Lakshmikanth NAMBURI
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED PROBE ARRAY
- Publication number 20130234746
- Publication date Sep 12, 2013
- Advantest Corporation
- Lakshmikanth NAMBURI
- G01 - MEASURING TESTING
Information Patent Application
TRANSFERRING ELECTRONIC PROBE ASSEMBLIES TO SPACE TRANSFORMERS
- Publication number 20130234748
- Publication date Sep 12, 2013
- Advantest Corporation
- Lakshmikanth NAMBURI
- G01 - MEASURING TESTING
Information Patent Application
FINE PITCH PROBE ARRAY FROM BULK MATERIAL
- Publication number 20130234747
- Publication date Sep 12, 2013
- Advantest Corporation
- Lakshmikanth NAMBURI
- G01 - MEASURING TESTING