Lam T. Luu

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Moorpark, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Detecting a deposition condition
- Patent number 8,546,205
- Issue date Oct 1, 2013
- Skyworks Solutions, Inc.
- Lam T. Luu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods of evaporating metal onto a semiconductor wafer in a test w...
- Patent number 8,481,344
- Issue date Jul 9, 2013
- Skyworks Solutions, Inc.
- Lam T. Luu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and methods for detecting evaporation conditions
- Patent number 8,030,725
- Issue date Oct 4, 2011
- Skyworks Solutions, Inc.
- Lam T. Luu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and methods for evaporation including test wafer holder
- Patent number 8,022,448
- Issue date Sep 20, 2011
- Skyworks Solutions, Inc.
- Lam T. Luu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS, DEVICES AND METHODS RELATED TO REACTIVE EVAPORATION OF REF...
- Publication number 20150152543
- Publication date Jun 4, 2015
- SKYWORKS SOLUTIONS, INC.
- Shiban Kishan TIKU
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
DETECTING A DEPOSITION CONDITION
- Publication number 20120083050
- Publication date Apr 5, 2012
- SKYWORKS SOLUTIONS, INC.
- Lam T. Luu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS OF EVAPORATING METAL ONTO A SEMICONDUCTOR WAFER IN A TEST W...
- Publication number 20120083118
- Publication date Apr 5, 2012
- SKYWORKS SOLUTIONS, INC.
- Lam T. Luu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...