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Lance A. Forsberg
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Beaverton, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Simple integrated control for zoom/pan functions
Patent number
7,847,792
Issue date
Dec 7, 2010
Tektronix, Inc.
Scott R. Ketterer
G01 - MEASURING TESTING
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Patent Grant
User-placed marks in a long record length waveform
Patent number
7,516,028
Issue date
Apr 7, 2009
Tektronix, Inc.
Keith D. Rule
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DEVICE AND METHOD FOR WAVEFORM SEARCHING BY EXAMPLE
Publication number
20230333148
Publication date
Oct 19, 2023
Tektronix, Inc.
Lance H. Forsberg
G01 - MEASURING TESTING
Information
Patent Application
Simple integrated control for zoom/pan functions
Publication number
20070035658
Publication date
Feb 15, 2007
Scott R. Ketterer
G01 - MEASURING TESTING
Information
Patent Application
User-placed marks in a long record length waveform
Publication number
20070038397
Publication date
Feb 15, 2007
Keith D. Rule
G01 - MEASURING TESTING