Lance Stevens

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Burnsville, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Interface apparatus and methods of testing integrated circuits usin...
- Patent number 7,906,982
- Issue date Mar 15, 2011
- Cypress Semiconductor Corporation
- Richard Meade
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device test system and method
- Patent number 7,474,979
- Issue date Jan 6, 2009
- Cypress Semiconductor Corporation
- Lance Stevens
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...