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Larry Arlos Bullock
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Carrollton, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Signal conversion system for optical sensors
Patent number
11,725,985
Issue date
Aug 15, 2023
Verity Instruments, Inc.
Larry Arlos Bullock
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Multimode configurable spectrometer
Patent number
11,424,115
Issue date
Aug 23, 2022
Verity Instruments, Inc.
Larry Arlos Bullock
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High dynamic range measurement system for process monitoring
Patent number
9,801,265
Issue date
Oct 24, 2017
Verity Instruments, Inc.
Larry Arlos Bullock
G01 - MEASURING TESTING
Information
Patent Grant
High dynamic range measurement system for process monitoring
Patent number
9,310,250
Issue date
Apr 12, 2016
Verity Instruments, Inc.
Larry Arlos Bullock
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
FIBEROPTICAL CABLE ASSEMBLIES AND INTERFACES FOR SPECTROMETERS
Publication number
20230280560
Publication date
Sep 7, 2023
Verity Instruments, Inc.
Larry Bullock
G02 - OPTICS
Information
Patent Application
MULTIMODE CONFIGURABLE SPECTROMETER
Publication number
20220406586
Publication date
Dec 22, 2022
Verity Instruments, Inc.
Larry Arlos Bullock
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL CONVERSION SYSTEM FOR OPTICAL SENSORS
Publication number
20190339130
Publication date
Nov 7, 2019
Verity Instruments, Inc.
Larry Arlos Bullock
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MULTIMODE CONFIGURABLE SPECTROMETER
Publication number
20180286650
Publication date
Oct 4, 2018
Verity Instruments, Inc.
Larry Arlos Bullock
G01 - MEASURING TESTING
Information
Patent Application
HIGH DYNAMIC RANGE MEASUREMENT SYSTEM FOR PROCESS MONITORING
Publication number
20160316546
Publication date
Oct 27, 2016
Verity Instruments, Inc.
Larry Arlos Bullock
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Monitoring Pulsed Plasma Processes
Publication number
20160131587
Publication date
May 12, 2016
Verity Instruments, Inc.
Mark Anthony Meloni
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Measuring Process Parameters of a Plasma E...
Publication number
20130016344
Publication date
Jan 17, 2013
Larry Bullock
G01 - MEASURING TESTING