Larry E. Plew

Person

St. Cloud, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe having a microstylet
- Patent number 6,727,720
- Issue date Apr 27, 2004
- Agere Systems Inc.
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor manufacturing using modular substrates
- Patent number 6,713,409
- Issue date Mar 30, 2004
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three dimensional reconstruction metrology
- Patent number 6,714,892
- Issue date Mar 30, 2004
- Agere Systems, INC
- Erik Cho Houge
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for minimizing semiconductor wafer contamination
- Patent number 6,695,572
- Issue date Feb 24, 2004
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process control using three dimensional reconstruction metrology
- Patent number 6,651,226
- Issue date Nov 18, 2003
- Agere Systems, INC
- Erik Cho Houge
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray system
- Patent number 6,606,371
- Issue date Aug 12, 2003
- Agere Systems Inc.
- Michael Antonell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of determining a crystallographic quality of a material loca...
- Patent number 6,577,970
- Issue date Jun 10, 2003
- Agere Systems Inc.
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Modular semiconductor substrates
- Patent number 6,534,851
- Issue date Mar 18, 2003
- Agere Systems, INC
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe tip locator having improved marker arrangement for reduced bi...
- Patent number 6,425,189
- Issue date Jul 30, 2002
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for scanning probe microscopy and related methods
- Patent number 6,405,584
- Issue date Jun 18, 2002
- Agere Systems Guardian Corp.
- Jeffrey Bruce Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of mapping a surface using a probe for stylus nanoprofilomet...
- Patent number 6,250,143
- Issue date Jun 26, 2001
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for holding and aligning a scanning electron microscope s...
- Patent number 6,246,060
- Issue date Jun 12, 2001
- Agere Systems Guardian Corp.
- Michael A. Ackeret
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Linewidth metrology of integrated circuit structures
- Patent number 5,804,460
- Issue date Sep 8, 1998
- Lucent Technologies, Inc.
- Jeffrey Bruce Bindell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor manufacturing using modular substrates
- Publication number 20030107117
- Publication date Jun 12, 2003
- Agere Systems Inc.
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for minimizing semiconductor wafer contamination
- Publication number 20030063967
- Publication date Apr 3, 2003
- Michael Antonell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe having a microstylet and method of manufacturing the same
- Publication number 20030042922
- Publication date Mar 6, 2003
- Erik C. Houge
- B82 - NANO-TECHNOLOGY
Information Patent Application
Process control using three dimensional reconstruction metrology
- Publication number 20020170021
- Publication date Nov 14, 2002
- Erik Cho Houge
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Three dimensional reconstruction metrology
- Publication number 20020156594
- Publication date Oct 24, 2002
- Erik Cho Houge
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Laboratory specimen sampler with integrated specimen mount
- Publication number 20020150509
- Publication date Oct 17, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
Method of determining a crystallographic quality of a material loca...
- Publication number 20020128789
- Publication date Sep 12, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING THE SHAPE OF A PROBE FOR A STYLUS PROFILOMETER
- Publication number 20020062572
- Publication date May 30, 2002
- Jeffrey Bruce Bindell
- G01 - MEASURING TESTING
Information Patent Application
X-ray system
- Publication number 20010043667
- Publication date Nov 22, 2001
- Michael Antonell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Larry E. Plew

Person

Patents Grantslast 30 patents

Probe having a microstylet

Semiconductor manufacturing using modular substrates

Three dimensional reconstruction metrology

Method and apparatus for minimizing semiconductor wafer contamination

Process control using three dimensional reconstruction metrology

X-ray system

Method of determining a crystallographic quality of a material loca...

Modular semiconductor substrates

Probe tip locator having improved marker arrangement for reduced bi...

Probe for scanning probe microscopy and related methods

Method of mapping a surface using a probe for stylus nanoprofilomet...

Apparatus for holding and aligning a scanning electron microscope s...

Linewidth metrology of integrated circuit structures

Patents Applicationslast 30 patents

Semiconductor manufacturing using modular substrates

Method and apparatus for minimizing semiconductor wafer contamination

Probe having a microstylet and method of manufacturing the same

Process control using three dimensional reconstruction metrology

Three dimensional reconstruction metrology

Laboratory specimen sampler with integrated specimen mount

Method of determining a crystallographic quality of a material loca...

METHOD OF DETERMINING THE SHAPE OF A PROBE FOR A STYLUS PROFILOMETER

X-ray system