Larry R. Lockwood

Person

  • McMinnville, OR, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Electrostatic discharge testing device

    • Patent number 4,935,839
    • Issue date Jun 19, 1990
    • Trisys, Inc.
    • Larry R. Lockwood
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer probe

    • Patent number 4,697,143
    • Issue date Sep 29, 1987
    • Cascade Microtech, Inc.
    • Larry R. Lockwood
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Phase detector

    • Patent number 4,654,600
    • Issue date Mar 31, 1987
    • Tektronix, Inc.
    • Larry R. Lockwood
    • G01 - MEASURING TESTING