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Larry R. Lockwood
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McMinnville, OR, US
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last 30 patents
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Patent Grant
Electrostatic discharge testing device
Patent number
4,935,839
Issue date
Jun 19, 1990
Trisys, Inc.
Larry R. Lockwood
G01 - MEASURING TESTING
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Patent Grant
Wafer probe
Patent number
4,697,143
Issue date
Sep 29, 1987
Cascade Microtech, Inc.
Larry R. Lockwood
G01 - MEASURING TESTING
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Patent Grant
Phase detector
Patent number
4,654,600
Issue date
Mar 31, 1987
Tektronix, Inc.
Larry R. Lockwood
G01 - MEASURING TESTING