Larry Varnerin

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Pleasant Valley, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Sub-resolution sized assist features
- Patent number 7,141,338
- Issue date Nov 28, 2006
- Infineon Technologies AG
- Xiaochun Linda Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Direct, non-destructive measurement of recess depth in a wafer
- Patent number 6,708,559
- Issue date Mar 23, 2004
- Infineon Technologies AG
- Linda X. Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wafer processing techniques with enhanced alignment
- Publication number 20050059255
- Publication date Mar 17, 2005
- Infineon Technologies North America Corp.
- Lawrence John Varnerin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Pattern transfer in device fabrication
- Publication number 20040121264
- Publication date Jun 24, 2004
- Bernhard Liegl
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Sub-resolution sized assist features
- Publication number 20040091790
- Publication date May 13, 2004
- Infineon Technologies North America Corp.
- Xiaochun Linda Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Direct, non-destructive measurement of recess depth in a wafer
- Publication number 20030061890
- Publication date Apr 3, 2003
- Infineon Technologies North America Corp.
- Linda X. Chen
- G01 - MEASURING TESTING