Lars-christian Anklamm

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Berlin, DE

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Patents Grantslast 30 patents

Information Patent Grant
Measuring device and method of operating a measuring device
- Patent number 12,146,733
- Issue date Nov 19, 2024
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining a layer thickness and method of operating...
- Patent number 12,061,077
- Issue date Aug 13, 2024
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR PROCESSING DATA ASSOCIATED WITH A MODEL CHARA...
- Publication number 20230388033
- Publication date Nov 30, 2023
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Ruediger Maestle
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND DEVICE FOR PROCESSING DATA ASSOCIATED WITH A MODEL
- Publication number 20230314316
- Publication date Oct 5, 2023
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Ruediger Maestle
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DETERMINING A LAYER THICKNESS AND METHOD OF OPERATING...
- Publication number 20220205777
- Publication date Jun 30, 2022
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ MEASURING DEVICE AND METHOD OF OPERATING A TERAHERTZ MEAS...
- Publication number 20220091028
- Publication date Mar 24, 2022
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Rüdiger Mästle
- G01 - MEASURING TESTING