Lars Markwort

Person

Muehltal, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for inspecting bonded wafers
- Patent number 9,355,919
- Issue date May 31, 2016
- Nanda Technologies GmbH
- Markus Estermann
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,236,225
- Issue date Jan 12, 2016
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor wafer inspection system and method
- Patent number 9,182,357
- Issue date Nov 10, 2015
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,012,867
- Issue date Apr 21, 2015
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of inspecting and processing semiconductor wafers
- Patent number 8,778,702
- Issue date Jul 15, 2014
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,748,845
- Issue date Jun 10, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of inspecting and manufacturing semiconductor wafers
- Patent number 8,501,503
- Issue date Aug 6, 2013
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Methods of processing and inspecting semiconductor substrates
- Patent number 8,460,946
- Issue date Jun 11, 2013
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system and method
- Patent number 8,368,881
- Issue date Feb 5, 2013
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system and method
- Patent number 8,345,232
- Issue date Jan 1, 2013
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,110,814
- Issue date Feb 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical inspection system and method
- Patent number 8,102,521
- Issue date Jan 24, 2012
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system and method
- Patent number 8,072,591
- Issue date Dec 6, 2011
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,360
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,488,952
- Issue date Feb 10, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,485,873
- Issue date Feb 3, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20150213997
- Publication date Jul 30, 2015
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20140306121
- Publication date Oct 16, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS AND SYSTEMS FOR INSPECTING BONDED WAFERS
- Publication number 20130157391
- Publication date Jun 20, 2013
- Nanda Technologies GmbH
- Markus Estermann
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF INSPECTING AND MANUFACTURING SEMICONDUCTOR WAFERS
- Publication number 20120276664
- Publication date Nov 1, 2012
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER INSPECTION SYSTEM AND METHOD
- Publication number 20120268585
- Publication date Oct 25, 2012
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING AND PROCESSING SEMICONDUCTOR WAFERS
- Publication number 20120142122
- Publication date Jun 7, 2012
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20120141693
- Publication date Jun 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
OPTICAL INSPECTION SYSTEM AND METHOD
- Publication number 20120133760
- Publication date May 31, 2012
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF PROCESSING AND INSPECTING SEMICONDUCTOR SUBSTRATES
- Publication number 20120094401
- Publication date Apr 19, 2012
- IMEC
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM AND METHOD
- Publication number 20110043798
- Publication date Feb 24, 2011
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INPSECTION SYSTEM AND METHOD
- Publication number 20110043796
- Publication date Feb 24, 2011
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM AND METHOD
- Publication number 20100231902
- Publication date Sep 16, 2010
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20090179161
- Publication date Jul 16, 2009
- ALIS Corporation
- BILLY W. WARD
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070210250
- Publication date Sep 13, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070194251
- Publication date Aug 23, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070194226
- Publication date Aug 23, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY

Lars Markwort

Person

Patents Grantslast 30 patents

Methods and systems for inspecting bonded wafers

Ion sources, systems and methods

Semiconductor wafer inspection system and method

Ion sources, systems and methods

Method of inspecting and processing semiconductor wafers

Ion sources, systems and methods

Methods of inspecting and manufacturing semiconductor wafers

Methods of processing and inspecting semiconductor substrates

Optical inspection system and method

Optical inspection system and method

Ion sources, systems and methods

Optical inspection system and method

Optical inspection system and method

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Patents Applicationslast 30 patents

ION SOURCES, SYSTEMS AND METHODS

ION SOURCES, SYSTEMS AND METHODS

METHODS AND SYSTEMS FOR INSPECTING BONDED WAFERS

METHODS OF INSPECTING AND MANUFACTURING SEMICONDUCTOR WAFERS

SEMICONDUCTOR WAFER INSPECTION SYSTEM AND METHOD

METHOD OF INSPECTING AND PROCESSING SEMICONDUCTOR WAFERS

ION SOURCES, SYSTEMS AND METHODS

OPTICAL INSPECTION SYSTEM AND METHOD

METHODS OF PROCESSING AND INSPECTING SEMICONDUCTOR SUBSTRATES

OPTICAL INSPECTION SYSTEM AND METHOD

OPTICAL INPSECTION SYSTEM AND METHOD

OPTICAL INSPECTION SYSTEM AND METHOD

ION SOURCES, SYSTEMS AND METHODS

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods