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Larson Lindholm
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Boise, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods of forming semiconductor devices having recesses
Patent number
9,219,001
Issue date
Dec 22, 2015
Micron Technology, Inc.
Aaron R. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming vertical field effect transistors, vertical fiel...
Patent number
9,041,086
Issue date
May 26, 2015
Micron Technology, Inc.
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor structures including dual fins
Patent number
8,497,530
Issue date
Jul 30, 2013
Micron Technology, Inc.
Aaron R. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming vertical field effect transistors, vertical fiel...
Patent number
8,211,763
Issue date
Jul 3, 2012
Micron Technologies, Inc.
Larson D. Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having reduced sub-threshold leakage
Patent number
8,178,911
Issue date
May 15, 2012
Micron Technology, Inc.
David K. Hwang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor structures including dual fins
Patent number
8,138,526
Issue date
Mar 20, 2012
Micron Technology, Inc.
Aaron R. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having reduced sub-threshold leakage
Patent number
8,022,473
Issue date
Sep 20, 2011
Micron Technology, Inc.
David K. Hwang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor constructions of memory devices with different sizes...
Patent number
7,948,030
Issue date
May 24, 2011
Micron Technology, Inc.
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming vertical field effect transistors, vertical fiel...
Patent number
7,910,971
Issue date
Mar 22, 2011
Micron Technology, Inc.
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having reduced sub-threshold leakage
Patent number
7,897,465
Issue date
Mar 1, 2011
Micron Technology, Inc.
David K. Hwang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of fabricating semiconductor devices including dual fin str...
Patent number
7,879,659
Issue date
Feb 1, 2011
Micron Technology, Inc.
Aaron R. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor constructions of memory device with different depth g...
Patent number
7,808,041
Issue date
Oct 5, 2010
Micron Technology, Inc.
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having reduced sub-threshold leakage
Patent number
7,696,568
Issue date
Apr 13, 2010
Micron Technology, Inc.
David K. Hwang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming semiconductor constructions, and methods of rece...
Patent number
7,648,915
Issue date
Jan 19, 2010
Micron Technology, Inc.
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHODS OF FORMING SEMICONDUCTOR DEVICES HAVING RECESSES
Publication number
20130309839
Publication date
Nov 21, 2013
Micron Technology, Inc.
Aaron R. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods of Forming Vertical Field Effect Transistors, Vertical Fiel...
Publication number
20120241831
Publication date
Sep 27, 2012
Micron Technology, Inc.
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR STRUCTURES INCLUDING DUAL FINS AND METHODS OF FABRICA...
Publication number
20120175748
Publication date
Jul 12, 2012
Micron Technology, Inc.
Aaron R. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING REDUCED SUB-THRESHOLD LEAKAGE
Publication number
20120003810
Publication date
Jan 5, 2012
Micron Technology, Inc.
David K. Hwang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods of Forming Vertical Field Effect Transistors, Vertical Fiel...
Publication number
20110140187
Publication date
Jun 16, 2011
Micron Technology, Inc.
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING REDUCED SUB-THRESHOLD LEAKAGE
Publication number
20110133263
Publication date
Jun 9, 2011
Micron Technology, Inc.
David K. Hwang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR STRUCTURES INCLUDING DUAL FINS
Publication number
20110057269
Publication date
Mar 10, 2011
Micron Technology, Inc.
Aaron R. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Constructions
Publication number
20100327369
Publication date
Dec 30, 2010
Micron Technology, Inc.
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING REDUCED SUB-THRESHOLD LEAKAGE
Publication number
20100171170
Publication date
Jul 8, 2010
Micron Technology, Inc.
David K. Hwang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Constructions
Publication number
20100072557
Publication date
Mar 25, 2010
Micron Technology, Inc.
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods Of Forming Vertical Field Effect Transistors, vertical fiel...
Publication number
20100032739
Publication date
Feb 11, 2010
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS OF FABRICATING DUAL FIN STRUCTURES AND SEMICONDUCTOR DEVICE...
Publication number
20090026530
Publication date
Jan 29, 2009
Micron Technology, Inc.
Aaron R. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having reduced sub-threshold leakage
Publication number
20080290387
Publication date
Nov 27, 2008
Micron Technology, Inc.
David K. Hwang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor constructions, methods of forming semiconductor const...
Publication number
20080169504
Publication date
Jul 17, 2008
Micron Technology, Inc.
Larson Lindholm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods for independently controlling one or more etching parameter...
Publication number
20070045230
Publication date
Mar 1, 2007
Micron Technology, Inc.
David J. Keller
H01 - BASIC ELECTRIC ELEMENTS