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last 30 patents
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Patent Grant
Micro photoluminescence imaging
Patent number
10,883,941
Issue date
Jan 5, 2021
SEMILAB Semiconductor Physics Laboratory Co., Ltd.
Zoltan Tamas Kiss
G01 - MEASURING TESTING
Information
Patent Grant
Micro photoluminescence imaging with optical filtering
Patent number
10,209,190
Issue date
Feb 19, 2019
SEMILAB Semiconductor Physics Laboratory Co., Ltd.
Zoltan Tamas Kiss
G01 - MEASURING TESTING
Information
Patent Grant
Micro photoluminescence imaging with optical filtering
Patent number
10,018,565
Issue date
Jul 10, 2018
SEMILAB Semiconductor Physics Laboratory Co., Ltd.
Zoltan Tamas Kiss
G01 - MEASURING TESTING
Information
Patent Grant
Micro photoluminescence imaging
Patent number
10,012,593
Issue date
Jul 3, 2018
SEMILAB Semiconductor Physics Laboratory Co., Ltd.
Zoltan Tamas Kiss
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
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Patent Application
PHOTOLUMINESCENT IMAGING OF SEMICONDUCTOR SAMPLES
Publication number
20240280473
Publication date
Aug 22, 2024
Zoltán Tamás KISS
G01 - MEASURING TESTING
Information
Patent Application
MICRO PHOTOLUMINESCENCE IMAGING
Publication number
20200300767
Publication date
Sep 24, 2020
SEMILAB Semiconductor Physics Laboratory Co., Ltd.
Zoltan Tamas Kiss
G01 - MEASURING TESTING
Information
Patent Application
Micro Photoluminescence Imaging
Publication number
20190391079
Publication date
Dec 26, 2019
SEMILAB Semiconductor Physics Laboratory Co., Ltd.
Zoltan Tamas Kiss
G01 - MEASURING TESTING
Information
Patent Application
MICRO PHOTOLUMINESCENCE IMAGING WITH OPTICAL FILTERING
Publication number
20180313761
Publication date
Nov 1, 2018
Zoltan Tamas Kiss
G01 - MEASURING TESTING
Information
Patent Application
MICRO PHOTOLUMINESCENCE IMAGING WITH OPTICAL FILTERING
Publication number
20160327485
Publication date
Nov 10, 2016
Semilab SDI LLC
Zoltan Tamas Kiss
G01 - MEASURING TESTING
Information
Patent Application
Micro Photoluminescence Imaging
Publication number
20160328840
Publication date
Nov 10, 2016
Semilab SDI LLC
Zoltan Tamas Kiss
G01 - MEASURING TESTING