Laudie J. Doubrava

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Tigard, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Virtual model adapter removal and substitution technique for cascad...
- Patent number 9,581,675
- Issue date Feb 28, 2017
- Tektronix, Inc.
- Laudie J. Doubrava
- G01 - MEASURING TESTING
Information Patent Grant
Calibrated S-parameter measurements of a high impedance probe
- Patent number 7,994,801
- Issue date Aug 9, 2011
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope based return loss analyzer
- Patent number 7,271,575
- Issue date Sep 18, 2007
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VIRTUAL MODEL ADAPTER REMOVAL AND SUBSTITUTION TECHNIQUE FOR CASCAD...
- Publication number 20140058693
- Publication date Feb 27, 2014
- Tektronix, Inc.
- Laudie J. Doubrava
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATED S-PARAMETER MEASUREMENTS OF A HIGH IMPEDANCE PROBE
- Publication number 20080278176
- Publication date Nov 13, 2008
- Tektronix, Inc.
- William A. HAGERUP
- G01 - MEASURING TESTING
Information Patent Application
Oscilloscope based return loss analyzer
- Publication number 20040027138
- Publication date Feb 12, 2004
- John J. Pickerd
- G01 - MEASURING TESTING