Laura Faulk

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for controlling etch selectivity
- Patent number 7,456,110
- Issue date Nov 25, 2008
- Advanced Micro Devices, Inc.
- Jeremy S. Lansford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Residue removal by CO2 water rinse in conjunction with post metal e...
- Patent number 6,328,905
- Issue date Dec 11, 2001
- Advanced Micro Devices, Inc.
- Joseph Lebowitz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for controlling etch selectivity
- Publication number 20050098535
- Publication date May 12, 2005
- Advanced Micro Devices, Inc.
- Jeremy S. Lansford
- H01 - BASIC ELECTRIC ELEMENTS