Laurence Reeves

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Crowthorne, GB

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Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test hierarchy for an integrated circuit
- Patent number 7,005,873
- Issue date Feb 28, 2006
- Agere Systems Inc.
- Llyoung Kim
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Built-in self-test hierarchy for an integrated circuit
- Publication number 20040128600
- Publication date Jul 1, 2004
- Ilyoung Kim
- G01 - MEASURING TESTING